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Walter van Bodegom

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Ultramicroscopy|February 26, 2026
Exploring 4D-STEM in SEM with an event-driven direct electron detector: Low-dose, high-speed, and sparse dataBowen Liu, Zheng Hu, Walter van Bodegom, et al.
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Pageof 1
Ultramicroscopy|February 26, 2026
Exploring 4D-STEM in SEM with an event-driven direct electron detector: Low-dose, high-speed, and sparse dataBowen Liu, Zheng Hu, Walter van Bodegom, et al.
Pageof 1