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Ultramicroscopy
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February 26, 2026
Exploring 4D-STEM in SEM with an event-driven direct electron detector: Low-dose, high-speed, and sparse data
Bowen Liu, Zheng Hu, Walter van Bodegom, et al.
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of 1
Search research articles
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Showing results (1-10 of 1) with videos related to
Sort By:
Page
of 1
Ultramicroscopy
|
February 26, 2026
Exploring 4D-STEM in SEM with an event-driven direct electron detector: Low-dose, high-speed, and sparse data
Bowen Liu, Zheng Hu, Walter van Bodegom, et al.
Page
of 1