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Microscopy Research and Technique|February 5, 2022
Linearizing the frequency-stiffness relation in contact resonance atomic force microscopy for facilitated mechanical characterizationWenting Wang, Wenhao Zhang, Yuhang Chen
Optics Letters|February 2, 2021
Detection of ion implantation in focused ion beam processing by scattering-type scanning near-field optical microscopyWenhao Zhang, Kaidi Zhang, Wenting Wang, et al.
Nanotechnology|August 15, 2022
Accurate determination of MFM tip's magnetic parameters on nanoparticles by decoupling the influence of electrostatic forceXiqi Wu, Wenhao Zhang, Wenting Wang, et al.
Nanotechnology|March 30, 2021
Multifunctional cantilevers for simultaneous enhancement of contact resonance and harmonic atomic force microscopyWenting Wang, Kaidi Zhang, Wenhao Zhang, et al.
ACS Applied Materials & Interfaces|November 1, 2021
Measurement of Film-Elastomer Interface Adhesion by Continuous BucklingWenting Wang, Wenhao Zhang, Xiqi Wu, et al.
Optics Express|April 1, 2020
Visibility of subsurface nanostructures in scattering-type scanning near-field optical microscopy imagingWenhao Zhang, Yuhang Chen
Nanophotonics (Berlin, Germany)|December 5, 2024
Dual-resonance sensing for environmental refractive index based on quasi-BIC states in all-dielectric metasurfaceWenjie Chen, Ming Li, Wenhao Zhang, et al.
ACS Applied Materials & Interfaces|March 1, 2023
Fabrication of a VO2-Based Tunable Metasurface by Electric-Field Scanning Probe Lithography with Precise Depth ControlWenhao Zhang, Xiqi Wu, Liang Li, et al.
Ultramicroscopy|September 2, 2019
Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensingWeijie Zhang, Yuhang Chen, Yaoping Hou, et al.
Beilstein Journal of Nanotechnology|August 31, 2019
Subsurface imaging of flexible circuits via contact resonance atomic force microscopyWenting Wang, Chengfu Ma, Yuhang Chen, et al.
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