Linearizing the frequency-stiffness relation in contact resonance atomic force microscopy for facilitated mechanical

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Wenting Wang1,2, Wenhao Zhang1,2, Yuhang Chen1,2

  • 1Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China.

Microscopy Research and Technique
|February 5, 2022
PubMed

Keywords:
atomic force microscopycantilever optimizationcontact resonanceelastic modulusmechanical characterization

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