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Physical Review Letters|June 4, 2008
Direct measurements of critical stresses and cracking in thin films of colloid dispersionsWeining Man, William B RusselLangmuir : the ACS Journal of Surfaces and Colloids|March 19, 2005
Limitations on length scales for electrostatically induced submicrometer pillars and holesLeonard F Pease, William B RusselThe Journal of Chemical Physics|November 23, 2006
Charge driven, electrohydrodynamic patterning of thin filmsLeonard F Pease, William B RusselLangmuir : the ACS Journal of Surfaces and Colloids|May 18, 2005
Cracking in drying latex filmsMahesh S Tirumkudulu, William B RusselLangmuir : the ACS Journal of Surfaces and Colloids|April 20, 2005
Role of capillary stresses in film formationMahesh S Tirumkudulu, William B RusselLangmuir : the ACS Journal of Surfaces and Colloids|January 17, 2008
Generalized Hertzian model for the deformation and cracking of colloidal packings saturated with liquidWilliam B Russel, Ning Wu, Weining ManPhysical Review. E, Statistical, Nonlinear, and Soft Matter Physics|April 7, 2010
Coarsening in the electrohydrodynamic patterning of thin polymer filmsNing Wu, Michail E Kavousanakis, William B RusselLangmuir : the ACS Journal of Surfaces and Colloids|December 14, 2005
Electric-field-induced patterns in thin polymer films: weakly nonlinear and fully nonlinear evolutionNing Wu, Leonard F Pease, William B RusselLangmuir : the ACS Journal of Surfaces and Colloids|October 19, 2005
Effect of hydrophobically modified polymers on shear-induced multilamellar vesiclesBing-Shiou Yang, William B Russel, Robert K Prud'hommePhysical Review. E, Statistical, Nonlinear, and Soft Matter Physics|December 17, 2004
Cylindrically symmetric electrohydrodynamic patterningParu Deshpande, Leonard F Pease, Lei Chen, et al.Pageof 2