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Micron (Oxford, England : 1993)|March 7, 2000
Dynamical simulation of LACBED patterns in cross-sectioned heterostructuresWu, Armigliato, Balboni, et al.Micron (Oxford, England : 1993)|March 7, 2000
TEM/CBED determination of strain in silicon-based submicrometric electronic devicesArmigliato, Balboni, Balboni, et al.Journal of Microscopy|April 21, 2007
Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profilesA Spessot, S Frabboni, R Balboni, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 18, 2006
Quantitative thin-film x-ray microanalysis by STEM/HAADF: statistical analysis for precision and accuracy determinationAldo Armigliato, Roberto Balboni, Rodolfo RosaJournal of Microscopy|October 4, 2007
Application of the parametric bootstrap method to determine statistical errors in quantitative X-ray microanalysis of thin filmsAldo Armigliato, Roberto Balboni, Rodolfo RosaMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 5, 2013
FIB preparation of a NiO Wedge-Lamella and STEM X-ray microanalysis for the determination of the experimental k(O-Ni) Cliff-Lorimer coefficientAldo Armigliato, Stefano Frabboni, Gian Carlo Gazzadi, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 1, 2018
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin FilmsAndrea Parisini, Stefano Frabboni, Gian Carlo Gazzadi, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 17, 2009
X-ray microanalysis combined with monte carlo simulation for the analysis of layered thin films: the case of carbon contaminationAldo Armigliato, Rodolfo RosaUltramicroscopy|May 21, 2016
Generation and application of bessel beams in electron microscopyVincenzo Grillo, Jérémie Harris, Gian Carlo Gazzadi, et al.Beilstein Journal of Nanotechnology|July 23, 2015
Structural transitions in electron beam deposited Co-carbonyl suspended nanowires at high electrical current densitiesGian Carlo Gazzadi, Stefano FrabboniPageof 72,951