Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

X Q Pan

Showing results (51-60 of 54) with videos related to

Pageof 6
Sort By:
You have reached the last page of results.This site can display upto 54 results.
Physical Review Letters|October 15, 2008
Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin filmsH W Jang, S H Baek, D Ortiz, et al.
Nature Communications|July 29, 2018
Chemically specific termination control of oxide interfaces via layer-by-layer mean inner potential engineeringH Y Sun, Z W Mao, T W Zhang, et al.
Science (New York, N.Y.)|September 16, 2006
Probing nanoscale ferroelectricity by ultraviolet Raman spectroscopyD A Tenne, A Bruchhausen, N D Lanzillotti-Kimura, et al.
Science (New York, N.Y.)|November 19, 2011
Giant piezoelectricity on Si for hyperactive MEMSS H Baek, J Park, D M Kim, et al.
Pageof 6

Showing results (51-60 of 54) with videos related to

Sort By:
Pageof 6
You have reached the last page of results.This site can display upto 54 results.
Physical Review Letters|October 15, 2008
Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin filmsH W Jang, S H Baek, D Ortiz, et al.
Nature Communications|July 29, 2018
Chemically specific termination control of oxide interfaces via layer-by-layer mean inner potential engineeringH Y Sun, Z W Mao, T W Zhang, et al.
Science (New York, N.Y.)|September 16, 2006
Probing nanoscale ferroelectricity by ultraviolet Raman spectroscopyD A Tenne, A Bruchhausen, N D Lanzillotti-Kimura, et al.
Science (New York, N.Y.)|November 19, 2011
Giant piezoelectricity on Si for hyperactive MEMSS H Baek, J Park, D M Kim, et al.
Pageof 6