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Journal of Microscopy|August 22, 2018
Self-consistent absorption correction for quantifying very noisy X-ray maps: group III nitride nanowires as an exampleX Wang, J Bai, T WaltherJournal of Microscopy|August 11, 2015
Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscopeT Walther, X WangJournal of Microscopy|September 30, 2017
Effective absorption correction for energy dispersive X-ray mapping in a scanning transmission electron microscope: analysing the local indium distribution in rough samples of InGaN alloy layersX Wang, M-P Chauvat, P Ruterana, et al.Journal of Physiology and Pharmacology : an Official Journal of the Polish Physiological Society|March 21, 2023
Neobavaisoflavone improves medial collateral ligament-induced osteoarthritis through repressing the nuclear factor -κB/hypoxia-inducible factor-2α axisJ Bai, T Liu, M Ren, et al.Journal of Microscopy|August 19, 2004
Development of a new analytical electron microscopy technique to quantify the chemistry of planar defects and to measure accurately solute segregation to grain boundariesT WaltherJournal of Microscopy|November 18, 2014
What environmental transmission electron microscopy measures and how this links to diffusivity: thermodynamics versus kineticsT WaltherJournal of Microscopy|December 27, 2025
Determining bismuth content in GaAsBi alloys by energy-dispersive X-ray spectroscopy: A case study with multiple sets of k*-factors for analytical transmission electron microscopyT WaltherJournal of Microscopy|August 17, 2006
Linear least-squares fit evaluation of series of analytical spectra from planar defects: extension and possible implementations in scanning transmission electron microscopyT WaltherPageof 1,088