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Xavier Colonna de Lega

Showing results (1-10 of 7) with videos related to

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Optics Letters|June 19, 2007
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometryPeter de Groot, Xavier Colonna de Lega
Applied Optics|September 29, 2004
Signal modeling for low-coherence height-scanning interference microscopyPeter de Groot, Xavier Colonna de Lega
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|September 9, 2020
Fourier optics modeling of interference microscopesPeter J de Groot, Xavier Colonna de Lega
Applied Optics|August 3, 2002
Determination of fringe order in white-light interference microscopyPeter de Groot, Xavier Colonna de Lega, Jim Kramer, et al.
Optics Express|June 11, 2008
Metrology of optically-unresolved features using interferometric surface profiling and RCWA modelingPeter de Groot, Xavier Colonna de Lega, Jan Liesener, et al.
Applied Optics|July 9, 2002
Optical interferometry for measurement of the geometric dimensions of industrial partsPeter de Groot, Jim Biegen, Jack Clark, et al.
Applied Optics|June 10, 2024
Linear systems characterization of the topographical spatial resolution of optical instrumentsPeter J de Groot, Zoulaiha Daouda, Leslie L Deck, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Optics Letters|June 19, 2007
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometryPeter de Groot, Xavier Colonna de Lega
Applied Optics|September 29, 2004
Signal modeling for low-coherence height-scanning interference microscopyPeter de Groot, Xavier Colonna de Lega
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|September 9, 2020
Fourier optics modeling of interference microscopesPeter J de Groot, Xavier Colonna de Lega
Applied Optics|August 3, 2002
Determination of fringe order in white-light interference microscopyPeter de Groot, Xavier Colonna de Lega, Jim Kramer, et al.
Optics Express|June 11, 2008
Metrology of optically-unresolved features using interferometric surface profiling and RCWA modelingPeter de Groot, Xavier Colonna de Lega, Jan Liesener, et al.
Applied Optics|July 9, 2002
Optical interferometry for measurement of the geometric dimensions of industrial partsPeter de Groot, Jim Biegen, Jack Clark, et al.
Applied Optics|June 10, 2024
Linear systems characterization of the topographical spatial resolution of optical instrumentsPeter J de Groot, Zoulaiha Daouda, Leslie L Deck, et al.
Pageof 1