Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Xue-Lei Du

Showing results (1-10 of 4) with videos related to

Pageof 1
Sort By:
Psych Journal|August 15, 2015
Peer-comparison overconfidence: Does it measure bias in self-evaluation?Yan-Ling Bi, Xue-Lei Du, Shu Li
Frontiers in Psychology|November 29, 2014
Probability expression for changeable and changeless uncertainties: an implicit testYun Wang, Xue-Lei Du, Li-Lin Rao, et al.
Frontiers in Human Neuroscience|February 3, 2016
ERP Correlates of Verbal and Numerical Probabilities in Risky Choices: A Two-Stage Probability Processing ViewShu Li, Xue-Lei Du, Qi Li, et al.
Journal of Experimental Psychology. Learning, Memory, and Cognition|May 22, 2013
Is making a risky choice based on a weighting and adding process? An eye-tracking investigationYin Su, Li-Lin Rao, Hong-Yue Sun, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Psych Journal|August 15, 2015
Peer-comparison overconfidence: Does it measure bias in self-evaluation?Yan-Ling Bi, Xue-Lei Du, Shu Li
Frontiers in Psychology|November 29, 2014
Probability expression for changeable and changeless uncertainties: an implicit testYun Wang, Xue-Lei Du, Li-Lin Rao, et al.
Frontiers in Human Neuroscience|February 3, 2016
ERP Correlates of Verbal and Numerical Probabilities in Risky Choices: A Two-Stage Probability Processing ViewShu Li, Xue-Lei Du, Qi Li, et al.
Journal of Experimental Psychology. Learning, Memory, and Cognition|May 22, 2013
Is making a risky choice based on a weighting and adding process? An eye-tracking investigationYin Su, Li-Lin Rao, Hong-Yue Sun, et al.
Pageof 1