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Y S J Yoo

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Ultramicroscopy|January 11, 2020
Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reductionT J Ruggles, Y S J Yoo, B E Dunlap, et al.
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Showing results (1-10 of 1) with videos related to

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Pageof 1
Ultramicroscopy|January 11, 2020
Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reductionT J Ruggles, Y S J Yoo, B E Dunlap, et al.
Pageof 1