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Yayi Wei

Showing results (1-10 of 61) with videos related to

Pageof 7
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Optics Express|October 13, 2022
Achieving high aspect ratio in plasmonic lithography for practical applications with sub-20 nm half pitchDandan Han, Yayi Wei
Applied Optics|April 3, 2024
Method for optical proximity correction based on a vector imaging modelRuixuan Wu, Lisong Dong, Yayi Wei
Applied Optics|April 3, 2024
SCAPSM: attenuated phase-shift mask structure for EUV lithographyChen Li, Lisong Dong, Yayi Wei
Optics Express|June 11, 2026
High-aspect-ratio plasmonic lithography via decaying feature amplificationChuang Wu, Dandan Han, Yayi Wei
Nanoscale Advances|August 28, 2023
Spatial modulation of scalable nanostructures by combining maskless plasmonic lithography and grayscale-patterned strategyDandan Han, Tianchun Ye, Yayi Wei
Applied Optics|March 10, 2021
Aberration optimization in an extreme ultraviolet lithography projector via a BP neural network and simulated annealing algorithmRongbo Zhao, Lisong Dong, Rui Chen, et al.
Nanotechnology|April 15, 2025
Enhancing lithographic accuracy by mitigating overlay errors via mask-induced thermal and mechanical optimizationDinghai Rui, Libin Zhang, Yayi Wei, et al.
Microsystems & Nanoengineering|April 3, 2023
Enhancement of pattern quality in maskless plasmonic lithography via spatial loss modulationDandan Han, Sen Deng, Tianchun Ye, et al.
Nanoscale Advances|September 8, 2025
Method of high-order advanced lithography overlay correction to enhance the manufacturing performance of integrated circuitsDinghai Rui, Libin Zhang, Yayi Wei, et al.
Optics Express|August 13, 2025
Fast simulation method of lithography latent image on non-planar wafer for large area maskYihan Zhao, Lisong Dong, Yayi Wei, et al.
Pageof 7

Showing results (1-10 of 61) with videos related to

Sort By:
Pageof 7
Optics Express|October 13, 2022
Achieving high aspect ratio in plasmonic lithography for practical applications with sub-20 nm half pitchDandan Han, Yayi Wei
Applied Optics|April 3, 2024
Method for optical proximity correction based on a vector imaging modelRuixuan Wu, Lisong Dong, Yayi Wei
Applied Optics|April 3, 2024
SCAPSM: attenuated phase-shift mask structure for EUV lithographyChen Li, Lisong Dong, Yayi Wei
Optics Express|June 11, 2026
High-aspect-ratio plasmonic lithography via decaying feature amplificationChuang Wu, Dandan Han, Yayi Wei
Nanoscale Advances|August 28, 2023
Spatial modulation of scalable nanostructures by combining maskless plasmonic lithography and grayscale-patterned strategyDandan Han, Tianchun Ye, Yayi Wei
Applied Optics|March 10, 2021
Aberration optimization in an extreme ultraviolet lithography projector via a BP neural network and simulated annealing algorithmRongbo Zhao, Lisong Dong, Rui Chen, et al.
Nanotechnology|April 15, 2025
Enhancing lithographic accuracy by mitigating overlay errors via mask-induced thermal and mechanical optimizationDinghai Rui, Libin Zhang, Yayi Wei, et al.
Microsystems & Nanoengineering|April 3, 2023
Enhancement of pattern quality in maskless plasmonic lithography via spatial loss modulationDandan Han, Sen Deng, Tianchun Ye, et al.
Nanoscale Advances|September 8, 2025
Method of high-order advanced lithography overlay correction to enhance the manufacturing performance of integrated circuitsDinghai Rui, Libin Zhang, Yayi Wei, et al.
Optics Express|August 13, 2025
Fast simulation method of lithography latent image on non-planar wafer for large area maskYihan Zhao, Lisong Dong, Yayi Wei, et al.
Pageof 7