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Yogesh Kashyap

Showing results (1-10 of 19) with videos related to

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The Review of Scientific Instruments|June 3, 2016
Speckle-based at-wavelength metrology of X-ray mirrors with super accuracyYogesh Kashyap, Hongchang Wang, Kawal Sawhney
Physical Review Letters|March 28, 2015
Hard-X-ray directional dark-field imaging using the speckle scanning techniqueHongchang Wang, Yogesh Kashyap, Kawal Sawhney
Scientific Reports|February 6, 2016
From synchrotron radiation to lab source: advanced speckle-based X-ray imaging using abrasive paperHongchang Wang, Yogesh Kashyap, Kawal Sawhney
Optics Express|September 15, 2015
Speckle based X-ray wavefront sensing with nanoradian angular sensitivityHongchang Wang, Yogesh Kashyap, Kawal Sawhney
Journal of Synchrotron Radiation|September 1, 2016
Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrorsYogesh Kashyap, Hongchang Wang, Kawal Sawhney
Optics Express|August 10, 2016
Experimental comparison between speckle and grating-based imaging technique using synchrotron radiation X-raysYogesh Kashyap, Hongchang Wang, Kawal Sawhney
Scientific Reports|July 29, 2016
High energy X-ray phase and dark-field imaging using a random absorption maskHongchang Wang, Yogesh Kashyap, Biao Cai, et al.
Journal of Synchrotron Radiation|July 3, 2015
Two-dimensional in situ metrology of X-ray mirrors using the speckle scanning techniqueHongchang Wang, Yogesh Kashyap, David Laundy, et al.
Applied Radiation and Isotopes : Including Data, Instrumentation and Methods for Use in Agriculture, Industry and Medicine|August 15, 2021
Fast neutron interrogation of special nuclear material using differential die-away techniqueTushar Roy, Yogesh Kashyap, Mayank Shukla, et al.
Journal of Synchrotron Radiation|September 3, 2021
The white beam station at imaging beamline BL-4, Indus-2Ashish K Agrawal, Balwant Singh, Payal Singhai, et al.
Pageof 2

Showing results (1-10 of 19) with videos related to

Sort By:
Pageof 2
The Review of Scientific Instruments|June 3, 2016
Speckle-based at-wavelength metrology of X-ray mirrors with super accuracyYogesh Kashyap, Hongchang Wang, Kawal Sawhney
Physical Review Letters|March 28, 2015
Hard-X-ray directional dark-field imaging using the speckle scanning techniqueHongchang Wang, Yogesh Kashyap, Kawal Sawhney
Scientific Reports|February 6, 2016
From synchrotron radiation to lab source: advanced speckle-based X-ray imaging using abrasive paperHongchang Wang, Yogesh Kashyap, Kawal Sawhney
Optics Express|September 15, 2015
Speckle based X-ray wavefront sensing with nanoradian angular sensitivityHongchang Wang, Yogesh Kashyap, Kawal Sawhney
Journal of Synchrotron Radiation|September 1, 2016
Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrorsYogesh Kashyap, Hongchang Wang, Kawal Sawhney
Optics Express|August 10, 2016
Experimental comparison between speckle and grating-based imaging technique using synchrotron radiation X-raysYogesh Kashyap, Hongchang Wang, Kawal Sawhney
Scientific Reports|July 29, 2016
High energy X-ray phase and dark-field imaging using a random absorption maskHongchang Wang, Yogesh Kashyap, Biao Cai, et al.
Journal of Synchrotron Radiation|July 3, 2015
Two-dimensional in situ metrology of X-ray mirrors using the speckle scanning techniqueHongchang Wang, Yogesh Kashyap, David Laundy, et al.
Applied Radiation and Isotopes : Including Data, Instrumentation and Methods for Use in Agriculture, Industry and Medicine|August 15, 2021
Fast neutron interrogation of special nuclear material using differential die-away techniqueTushar Roy, Yogesh Kashyap, Mayank Shukla, et al.
Journal of Synchrotron Radiation|September 3, 2021
The white beam station at imaging beamline BL-4, Indus-2Ashish K Agrawal, Balwant Singh, Payal Singhai, et al.
Pageof 2