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Journal of Electron Microscopy|July 13, 2002
Measurement of mean free paths for inelastic electron scattering of Si and SiO2Chang-Woo Lee, Yoichi Ikematsu, Daisuke ShindoJournal of Electron Microscopy|February 8, 2005
Characterization of DLC films by EELS and electron holographyDaisuke Shindo, Takayuki Musashi, Yoichi Ikematsu, et al.Journal of Electron Microscopy|May 11, 2002
Energy-filtered electron diffraction and high-resolution electron microscopy on short-range ordered structure in GaAs(0.5)Sb(0.5)Daisuke Shindo, Yoichi Ikematsu, Chang-Woo Lee, et al.Pageof 1