Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Yoichi Miyahara

Showing results (1-10 of 32) with videos related to

Pageof 4
Sort By:
Nanotechnology|August 7, 2012
Implementation of atomically defined field ion microscopy tips in scanning probe microscopyWilliam Paul, Yoichi Miyahara, Peter Grütter
Nano Letters|March 12, 2015
Revealing energy level structure of individual quantum dots by tunneling rate measured by single-electron sensitive electrostatic force spectroscopyAntoine Roy-Gobeil, Yoichi Miyahara, Peter Grutter
Nanotechnology|January 7, 2017
Quantum state readout of individual quantum dots by electrostatic force detectionYoichi Miyahara, Antoine Roy-Gobeil, Peter Grutter
The Review of Scientific Instruments|June 7, 2012
Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environmentsAleksander Labuda, Kei Kobayashi, Yoichi Miyahara, et al.
Nanotechnology|November 29, 2012
Layer-by-layer growth of sodium chloride overlayers on an Fe(001)-p(1 × 1)O surfaceAntoni Tekiel, Jessica Topple, Yoichi Miyahara, et al.
Nanotechnology|February 27, 2026
Improving the electrical conductivity of Pt- nanowires deposited by focused electron beam induced deposition using thermal annealingRajendra Rai, Ujjwal Dhakal, Binod Dc, et al.
The Review of Scientific Instruments|December 7, 2007
High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopyLynda Cockins, Yoichi Miyahara, Romain Stomp, et al.
Nanotechnology|November 2, 2013
Transient adhesion and conductance phenomena in initial nanoscale mechanical contacts between dissimilar metalsWilliam Paul, David Oliver, Yoichi Miyahara, et al.
Beilstein Journal of Nanotechnology|July 23, 2015
Improved atomic force microscopy cantilever performance by partial reflective coatingZeno Schumacher, Yoichi Miyahara, Laure Aeschimann, et al.
The Review of Scientific Instruments|February 3, 2019
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensorsOmur E Dagdeviren, Yoichi Miyahara, Aaron Mascaro, et al.
Pageof 4

Showing results (1-10 of 32) with videos related to

Sort By:
Pageof 4
Nanotechnology|August 7, 2012
Implementation of atomically defined field ion microscopy tips in scanning probe microscopyWilliam Paul, Yoichi Miyahara, Peter Grütter
Nano Letters|March 12, 2015
Revealing energy level structure of individual quantum dots by tunneling rate measured by single-electron sensitive electrostatic force spectroscopyAntoine Roy-Gobeil, Yoichi Miyahara, Peter Grutter
Nanotechnology|January 7, 2017
Quantum state readout of individual quantum dots by electrostatic force detectionYoichi Miyahara, Antoine Roy-Gobeil, Peter Grutter
The Review of Scientific Instruments|June 7, 2012
Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environmentsAleksander Labuda, Kei Kobayashi, Yoichi Miyahara, et al.
Nanotechnology|November 29, 2012
Layer-by-layer growth of sodium chloride overlayers on an Fe(001)-p(1 × 1)O surfaceAntoni Tekiel, Jessica Topple, Yoichi Miyahara, et al.
Nanotechnology|February 27, 2026
Improving the electrical conductivity of Pt- nanowires deposited by focused electron beam induced deposition using thermal annealingRajendra Rai, Ujjwal Dhakal, Binod Dc, et al.
The Review of Scientific Instruments|December 7, 2007
High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopyLynda Cockins, Yoichi Miyahara, Romain Stomp, et al.
Nanotechnology|November 2, 2013
Transient adhesion and conductance phenomena in initial nanoscale mechanical contacts between dissimilar metalsWilliam Paul, David Oliver, Yoichi Miyahara, et al.
Beilstein Journal of Nanotechnology|July 23, 2015
Improved atomic force microscopy cantilever performance by partial reflective coatingZeno Schumacher, Yoichi Miyahara, Laure Aeschimann, et al.
The Review of Scientific Instruments|February 3, 2019
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensorsOmur E Dagdeviren, Yoichi Miyahara, Aaron Mascaro, et al.
Pageof 4