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High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and

Lynda Cockins1, Yoichi Miyahara, Romain Stomp

  • 1Department of Physics, McGill University, 3600 Rue University, H3A 2T8 Montreal, Canada.

The Review of Scientific Instruments
|December 7, 2007
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...