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Nano Letters|March 12, 2015
Revealing energy level structure of individual quantum dots by tunneling rate measured by single-electron sensitive electrostatic force spectroscopyAntoine Roy-Gobeil, Yoichi Miyahara, Peter Grutter
Nanotechnology|January 7, 2017
Quantum state readout of individual quantum dots by electrostatic force detectionYoichi Miyahara, Antoine Roy-Gobeil, Peter Grutter
The Journal of Chemical Physics|September 17, 2018
Relating Franck-Condon blockade to redox chemistry in the single-particle pictureKirk H Bevan, Antoine Roy-Gobeil, Yoichi Miyahara, et al.
Nano Letters|August 21, 2019
Fully Quantized Electron Transfer Observed in a Single Redox Molecule at a Metal InterfaceAntoine Roy-Gobeil, Yoichi Miyahara, Kirk H Bevan, et al.
The Review of Scientific Instruments|December 7, 2007
High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopyLynda Cockins, Yoichi Miyahara, Romain Stomp, et al.
ACS Nano|May 4, 2013
Room-temperature single-electron charging detected by electrostatic force microscopyAntoni Tekiel, Yoichi Miyahara, Jessica M Topple, et al.
Nanotechnology|November 22, 2014
Scanning gate imaging of two coupled quantum dots in single-walled carbon nanotubesXin Zhou, James Hedberg, Yoichi Miyahara, et al.
ACS Nano|May 28, 2021
Charge Carrier Inversion in a Doped Thin Film Organic Semiconductor IslandZeno Schumacher, Rasa Rejali, Megan Cowie, et al.
Nano Letters|December 28, 2011
Excited-state spectroscopy on an individual quantum dot using atomic force microscopyLynda Cockins, Yoichi Miyahara, Steven D Bennett, et al.
Proceedings of the National Academy of Sciences of the United States of America|May 12, 2010
Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopyLynda Cockins, Yoichi Miyahara, Steven D Bennett, et al.
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