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Yong Bum Seo

Showing results (1-10 of 3) with videos related to

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Optics Express|June 6, 2013
Low cost wafer metrology using a NIR low coherence interferometryYoung Gwang Kim, Yong Bum Seo, Ki-Nam Joo
Optics Express|October 7, 2021
Single-shot spectrally resolved interferometry for the simultaneous measurement of the thickness and surface profile of multilayer filmsYoung-Sik Ghim, Yong Bum Seo, Ki-Nam Joo, et al.
Optics Express|March 4, 2020
Single-shot freeform surface profilerYong Bum Seo, Hyo Bin Jeong, Hyug-Gyo Rhee, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Optics Express|June 6, 2013
Low cost wafer metrology using a NIR low coherence interferometryYoung Gwang Kim, Yong Bum Seo, Ki-Nam Joo
Optics Express|October 7, 2021
Single-shot spectrally resolved interferometry for the simultaneous measurement of the thickness and surface profile of multilayer filmsYoung-Sik Ghim, Yong Bum Seo, Ki-Nam Joo, et al.
Optics Express|March 4, 2020
Single-shot freeform surface profilerYong Bum Seo, Hyo Bin Jeong, Hyug-Gyo Rhee, et al.
Pageof 1