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Yoon Keun Kwak

Showing results (1-10 of 4) with videos related to

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The Review of Scientific Instruments|June 3, 2009
Separation algorithm for a 2D refractive index distribution and thickness profile of a phase object by laser diode-based multiwavelength interferometryKwangchun Lee, Sung Yoon Ryu, Yoon Keun Kwak, et al.
Nanotechnology|May 7, 2009
Preferential elimination of metallic single-walled carbon nanotubes using microwave irradiationHyung Cheoul Shim, Jin-Won Song, Yoon Keun Kwak, et al.
Optics Express|June 25, 2009
Angle-resolved annular data acquisition method for microellipsometrySang-Heon Ye, Soo Hyun Kim, Yoon Keun Kwak, et al.
The Review of Scientific Instruments|July 2, 2010
Efficient fabrication of wafer scale thin film of individualized single-walled carbon nanotubes by dual-nozzle spin castingYong Shin Kim, Soongeun Kwon, Dong Hun Shin, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|June 3, 2009
Separation algorithm for a 2D refractive index distribution and thickness profile of a phase object by laser diode-based multiwavelength interferometryKwangchun Lee, Sung Yoon Ryu, Yoon Keun Kwak, et al.
Nanotechnology|May 7, 2009
Preferential elimination of metallic single-walled carbon nanotubes using microwave irradiationHyung Cheoul Shim, Jin-Won Song, Yoon Keun Kwak, et al.
Optics Express|June 25, 2009
Angle-resolved annular data acquisition method for microellipsometrySang-Heon Ye, Soo Hyun Kim, Yoon Keun Kwak, et al.
The Review of Scientific Instruments|July 2, 2010
Efficient fabrication of wafer scale thin film of individualized single-walled carbon nanotubes by dual-nozzle spin castingYong Shin Kim, Soongeun Kwon, Dong Hun Shin, et al.
Pageof 1