Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Yoon-Uk Heo

Applied microscopy

Showing results (1-10 of 3) with videos related to

Pageof 1
Sort By:
Applied Microscopy|February 13, 2021
Comparative study on the specimen thickness measurement using EELS and CBED methodsYoon-Uk Heo
Applied Microscopy|January 7, 2026
Effective elimination of Moiré fringe at the nanoprecipitate/matrix interfaceYoon-Uk Heo, Dongwon Lee, T T T Trang, et al.
Applied Microscopy|December 20, 2022
EPMA quantification on the chemical composition of retained austenite in a Fe-Mn-Si-C-based multi-phase steelYoon-Uk Heo, Chang-Gon Jeong, Soo-Hyun Kim, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Applied Microscopy|February 13, 2021
Comparative study on the specimen thickness measurement using EELS and CBED methodsYoon-Uk Heo
Applied Microscopy|January 7, 2026
Effective elimination of Moiré fringe at the nanoprecipitate/matrix interfaceYoon-Uk Heo, Dongwon Lee, T T T Trang, et al.
Applied Microscopy|December 20, 2022
EPMA quantification on the chemical composition of retained austenite in a Fe-Mn-Si-C-based multi-phase steelYoon-Uk Heo, Chang-Gon Jeong, Soo-Hyun Kim, et al.
Pageof 1