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Yoosuf N Picard

Showing results (1-10 of 4) with videos related to

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Nanotechnology|February 5, 2013
Pattern transfer with stabilized nanoparticle etch masksCharles R Hogg, Yoosuf N Picard, Amrit Narasimhan, et al.
Journal of Microscopy|September 3, 2011
Identifying threading dislocations in GaN films and substrates by electron channellingRanga J Kamaladasa, Fang Liu, Lisa M Porter, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 23, 2014
In situ TEM imaging of defect dynamics under electrical bias in resistive switching rutile-TiO₂Ranga J Kamaladasa, Abhishek A Sharma, Yu-Ting Lai, et al.
ACS Applied Materials & Interfaces|June 29, 2016
Transient Thermometry and High-Resolution Transmission Electron Microscopy Analysis of Filamentary Resistive SwitchesJonghan Kwon, Abhishek A Sharma, Chao-Yang Chen, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Nanotechnology|February 5, 2013
Pattern transfer with stabilized nanoparticle etch masksCharles R Hogg, Yoosuf N Picard, Amrit Narasimhan, et al.
Journal of Microscopy|September 3, 2011
Identifying threading dislocations in GaN films and substrates by electron channellingRanga J Kamaladasa, Fang Liu, Lisa M Porter, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 23, 2014
In situ TEM imaging of defect dynamics under electrical bias in resistive switching rutile-TiO₂Ranga J Kamaladasa, Abhishek A Sharma, Yu-Ting Lai, et al.
ACS Applied Materials & Interfaces|June 29, 2016
Transient Thermometry and High-Resolution Transmission Electron Microscopy Analysis of Filamentary Resistive SwitchesJonghan Kwon, Abhishek A Sharma, Chao-Yang Chen, et al.
Pageof 1