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Applied Optics
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April 27, 2012
Complete fringe order determination in scanning white-light interferometry using a Fourier-based technique
Young-Sik Ghim, Angela Davies
Optics Letters
|
November 16, 2019
Instantaneous thickness measurement of multilayer films by single-shot angle-resolved spectral reflectometry
Young-Sik Ghim, Hyug-Gyo Rhee
Applied Optics
|
February 3, 2009
Spectrally resolved white-light interferometry for 3D inspection of a thin-film layer structure
Young-Sik Ghim, Seung-Woo Kim
Optics Express
|
June 17, 2009
Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry
Young-Sik Ghim, Seung-Woo Kim
Optics Express
|
April 15, 2010
Reflectometry-based wavelength scanning interferometry for thickness measurements of very thin wafers
Young-Sik Ghim, Amit Suratkar, Angela Davies
Scientific Reports
|
September 21, 2017
Simultaneous measurements of top surface and its underlying film surfaces in multilayer film structure
Young-Sik Ghim, Hyug-Gyo Rhee, Angela Davies
Applied Optics
|
October 3, 2013
Application of the random ball test for calibrating slope-dependent errors in profilometry measurements
Yue Zhou, Young-Sik Ghim, Ali Fard, et al.
Scientific Reports
|
March 1, 2019
Single-shot deflectometry for dynamic 3D surface profile measurement by modified spatial-carrier frequency phase-shifting method
Manh The Nguyen, Young-Sik Ghim, Hyug-Gyo Rhee
Applied Optics
|
September 22, 2025
Slope boundary adjustment technique for zonal wavefront recovery method
Vu-Hai-Linh Nguyen, Young-Sik Ghim, Hyug-Gyo Rhee
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
June 10, 2026
Development of integrated diffractive optical elements for an optimized adjustable array-focus beam application
Hieu Tran Doan Trung, Young-Sik Ghim, Hyug-Gyo Rhee
Page
of 2
Search research articles
Search
Showing results (1-10 of 17) with videos related to
Sort By:
Page
of 2
Applied Optics
|
April 27, 2012
Complete fringe order determination in scanning white-light interferometry using a Fourier-based technique
Young-Sik Ghim, Angela Davies
Optics Letters
|
November 16, 2019
Instantaneous thickness measurement of multilayer films by single-shot angle-resolved spectral reflectometry
Young-Sik Ghim, Hyug-Gyo Rhee
Applied Optics
|
February 3, 2009
Spectrally resolved white-light interferometry for 3D inspection of a thin-film layer structure
Young-Sik Ghim, Seung-Woo Kim
Optics Express
|
June 17, 2009
Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry
Young-Sik Ghim, Seung-Woo Kim
Optics Express
|
April 15, 2010
Reflectometry-based wavelength scanning interferometry for thickness measurements of very thin wafers
Young-Sik Ghim, Amit Suratkar, Angela Davies
Scientific Reports
|
September 21, 2017
Simultaneous measurements of top surface and its underlying film surfaces in multilayer film structure
Young-Sik Ghim, Hyug-Gyo Rhee, Angela Davies
Applied Optics
|
October 3, 2013
Application of the random ball test for calibrating slope-dependent errors in profilometry measurements
Yue Zhou, Young-Sik Ghim, Ali Fard, et al.
Scientific Reports
|
March 1, 2019
Single-shot deflectometry for dynamic 3D surface profile measurement by modified spatial-carrier frequency phase-shifting method
Manh The Nguyen, Young-Sik Ghim, Hyug-Gyo Rhee
Applied Optics
|
September 22, 2025
Slope boundary adjustment technique for zonal wavefront recovery method
Vu-Hai-Linh Nguyen, Young-Sik Ghim, Hyug-Gyo Rhee
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
June 10, 2026
Development of integrated diffractive optical elements for an optimized adjustable array-focus beam application
Hieu Tran Doan Trung, Young-Sik Ghim, Hyug-Gyo Rhee
Page
of 2