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Scientific Reports
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January 17, 2025
YOLOSeg with applications to wafer die particle defect segmentation
Yen-Ting Li, Yu-Cheng Chan, Chen-Che Huang, et al.
ACS Nano
|
April 6, 2026
Dimensional Scaling Effect in Percolative Oxide Semiconductor Transistors
Robert Tseng, Yi-Hou Kuo, Yi-Yu Pan, et al.
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of 1
Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Scientific Reports
|
January 17, 2025
YOLOSeg with applications to wafer die particle defect segmentation
Yen-Ting Li, Yu-Cheng Chan, Chen-Che Huang, et al.
ACS Nano
|
April 6, 2026
Dimensional Scaling Effect in Percolative Oxide Semiconductor Transistors
Robert Tseng, Yi-Hou Kuo, Yi-Yu Pan, et al.
Page
of 1