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Ultramicroscopy|June 10, 2015
Combination of high spatial resolution and low minimum detection limit using thinned specimens in cutting-edge electron probe microanalysisYugo Kubo, Kotaro HamadaUltramicroscopy|July 24, 2013
Minimum detection limit and spatial resolution of thin-sample field-emission electron probe microanalysisYugo Kubo, Kotaro Hamada, Akira UranoAnalytical Chemistry|August 1, 2017
Nanoscale Phase-Separated Structure in Core-Shell Nanoparticles of SiO2-Si1-xGexO2 Glass Revealed by Electron MicroscopyYugo Kubo, Kazuhiro YonezawaMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 18, 2015
Observation of Fine Distribution of Minor Dopants in an Erbium-Doped Fiber Core using a Sample Thinning Technique for Field Emission Electron Probe MicroanalysisYugo Kubo, Koji KuramochiMasui. the Japanese Journal of Anesthesiology|February 26, 2013
[Management of cesarean section under general anesthesia using sugammadex]Kotaro Hamada, Kenji KayashimaMicroscopy (Oxford, England)|August 3, 2023
Nondestructive initial-profile-free 3D elemental mapping in multilayer thin film structures based on EDX and a quadratic programming problemYutaka Hoshina, Yugo Kubo, Yojiro NakayamaAnalytical Chemistry|April 23, 2016
High-Resolution Identification of Chemical States in Individual Metal Clusters in an Insulating Amorphous PolymerYugo Kubo, Akira Mizoguchi, Jun-Ichi FujitaMasui. the Japanese Journal of Anesthesiology|August 30, 2013
[A report of 6 cases with facial flushing, decreased arterial blood pressure and increased heart rate during thoracic surgery]Kotaro Hamada, Koji Hara, Takeyoshi SataJournal of Electron Microscopy|July 6, 2010
Energy-filtered imaging in a scanning electron microscope for dopant contrast in InPDaisuke Tsurumi, Kotaro Hamada, Yuji KawasakiACS Applied Materials & Interfaces|December 4, 2018
Fabrication of a Bilayer Structure of Cu and Polyimide To Realize Circuit Microminiaturization and High Interfacial Adhesion in Flexible Electronic DevicesYugo Kubo, Hirokazu Tanaka, Yoshihiro Saito, et al.Pageof 2