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The Review of Scientific Instruments|August 4, 2007
Application of a novel nonperiodic grating in scanning probe microscopy drift measurementYuhang Chen, Wenhao HuangAnalytical Sciences : the International Journal of the Japan Society for Analytical Chemistry|February 16, 2011
Automatic glitch elimination of scanning probe microscopy imagesYuhang Chen, Wenhao HuangJournal of Nanoscience and Nanotechnology|May 16, 2009
Influences of geometrical factors on quantitative surface roughness evaluations by atomic force microscopyYuhang Chen, Wenhao HuangJournal of Nanoscience and Nanotechnology|December 9, 2010
Optimization of zero-reference grating considering tip distortions for scanning probe microscopy drift measurementYuhang Chen, Wenhao HuangAnalytical Sciences : the International Journal of the Japan Society for Analytical Chemistry|February 16, 2011
Methods for vertical drift measurements of scanning probe microscopesDun Niu, Yuhang Chen, Wenhao HuangThe Review of Scientific Instruments|June 7, 2012
Optimal design and fabrication of three-dimensional calibration specimens for scanning probe microscopyXiaoning Liu, Tingting Luo, Yuhang Chen, et al.Optics Letters|July 29, 2010
Two-photon-induced polarization-multiplexed and multilevel storage in photoisomeric copolymer filmYanlei Hu, Zhoushun Zhang, Yuhang Chen, et al.Microscopy Research and Technique|April 23, 2015
Effects of temperature and humidity on atomic force microscopy dimensional measurementTian Wang, Chengfu Ma, Yuhang Chen, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 24, 2014
Spectral analysis of irregular roughness artifacts measured by atomic force microscopy and laser scanning microscopyYuhang Chen, Tingting Luo, Chengfu Ma, et al.Scanning|July 23, 2015
Improving dimensional measurement from noisy atomic force microscopy images by non-local means filteringYuhang ChenPageof 52