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Journal of Microscopy
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November 20, 2008
Electron tomography of regularly shaped nanostructures under non-linear image acquisition
Z Saghi, X Xu, G Möbus
Ultramicroscopy
|
October 21, 2015
A novel 3D absorption correction method for quantitative EDX-STEM tomography
Pierre Burdet, Z Saghi, A N Filippin, et al.
Microscopy Research and Technique
|
October 1, 2008
MRT letter: full-tilt electron tomography with a piezo-actuated rotary drive
X J Xu, A Lockwood, W Guan, et al.
Scientific Reports
|
August 26, 2018
Impact of pore anisotropy on the thermal conductivity of porous Si nanowires
P Ferrando-Villalba, L D'Ortenzi, G G Dalkiranis, et al.
Scientific Reports
|
October 6, 2018
Author Correction: Impact of pore anisotropy on the thermal conductivity of porous Si nanowires
P Ferrando-Villalba, L D'Ortenzi, G G Dalkiranis, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Journal of Microscopy
|
November 20, 2008
Electron tomography of regularly shaped nanostructures under non-linear image acquisition
Z Saghi, X Xu, G Möbus
Ultramicroscopy
|
October 21, 2015
A novel 3D absorption correction method for quantitative EDX-STEM tomography
Pierre Burdet, Z Saghi, A N Filippin, et al.
Microscopy Research and Technique
|
October 1, 2008
MRT letter: full-tilt electron tomography with a piezo-actuated rotary drive
X J Xu, A Lockwood, W Guan, et al.
Scientific Reports
|
August 26, 2018
Impact of pore anisotropy on the thermal conductivity of porous Si nanowires
P Ferrando-Villalba, L D'Ortenzi, G G Dalkiranis, et al.
Scientific Reports
|
October 6, 2018
Author Correction: Impact of pore anisotropy on the thermal conductivity of porous Si nanowires
P Ferrando-Villalba, L D'Ortenzi, G G Dalkiranis, et al.
Page
of 1