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Journal of Nanoscience and Nanotechnology|December 7, 2010
Nano-scale simulative measuring model for tapping mode atomic force microscopy and analysis for measuring a nano-scale ladder-shape standard sampleZone-Ching Lin, Ming-Ho ChouScanning|March 1, 2006
Analysis of point fabrication model for near-field photolithography with experimental studyZone-Ching Lin, Ching-Been YangScanning|July 16, 2008
Analysis of simulated scanning of atomic-scale silicon surface by atomic force microscopyZone-Ching Lin, Shih-Che LiuScanning|January 14, 2010
Inverse model of fiber probe aperture size using a non-destructive methodZone-Ching Lin, Ching-Been YangNanotechnology|July 7, 2011
A study of the estimation method of the cutting force for a conical tool under nanoscale depth of cut by molecular dynamicsZone-Ching Lin, Jen-Ching HuangScanning|August 20, 2009
Error analysis and regression mode of the V-grooved sample in the atomic force microscope simulation measurement mode by the molecular mechanicsZone-Ching Lin, Jen-Ching Huang, Chun-Hui YehPageof 1