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Acta Crystallographica. Section A, Foundations of Crystallography|June 22, 2006
Extended dynamical HAADF STEM image simulation using the Bloch-wave methodTakashi Yamazaki, Kazuto Watanabe, Koji Kuramochi, et al.Acta Crystallographica. Section A, Foundations of Crystallography|February 14, 2013
Multidimensional paperfolding systemsShelomo I Ben-Abraham, Alexander Quandt, Dekel ShapiraActa Crystallographica. Section A, Foundations of Crystallography|April 23, 2005
Absolute measurement of lattice parameter in single crystals and epitaxic layers on a double-crystal X-ray diffractometerM FatemiActa Crystallographica. Section A, Foundations of Crystallography|February 27, 2003
Theory of diffraction from D019 ordered c.p.h structures containing complex stacking faults on basal planesP Ghosal, S LeleActa Crystallographica. Section A, Foundations of Crystallography|April 14, 2011
Structure of planar defects in tilted perovskitesRichard BeanlandActa Crystallographica. Section A, Foundations of Crystallography|February 27, 2001
On the transition from the wurtzite to the NaCl typeH SowaActa Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
Simple tilings by polyhedra with five- and six-sided facesOlaf Delgado-Friedrichs, Michael O'KeeffeActa Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
Determination of Debye-Waller factor and structure factors for Si by quantitative convergent-beam electron diffraction using off-axis multi-beam orientationsX H Sang, A Kulovits, J M K WiezorekActa Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
Simultaneous determination of highly precise Debye-Waller factors and structure factors for chemically ordered NiAlX H Sang, A Kulovits, J M K WiezorekActa Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
X-ray diffraction peaks from correlated dislocations: Monte Carlo study of dislocation screeningVladimir M Kaganer, Karl K SabelfeldPageof 113