Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Applied optics

Showing results (1241-1250 of 50,909) with videos related to

Pageof 5,091
Sort By:
Applied Optics|November 5, 2002
Analysis of nanostructured porous films by measurement of adsorption isotherms with optical fiber and ellipsometryAlberto Alvarez-Herrero, Hector Guerrero, Eusebio Bernabeu, et al.
Applied Optics|November 5, 2002
Dopant-dependent reflectivity and refractive index of microcrystalline HxWO3 and LixWO3 bronze thin filmsZahid Hussain
Applied Optics|November 5, 2002
Method for evaluating optical characteristics of endoscopes for recording fluorescence-related cardiac electrical activitySoma Sau, Howard I Bassen, Victor Krauthamer
Applied Optics|January 28, 2003
Digital algorithm for dispersion correction in optical coherence tomography for homogeneous and stratified mediaDaniel L Marks, Amy L Oldenburg, J Joshua Reynolds, et al.
Applied Optics|January 28, 2003
Resolution improvement with dispersion manipulation and a retrieval algorithm in optical coherence tomographyI-Jen Hsu, Chia-Wei Sun, Chih-Wei Lu, et al.
Applied Optics|January 28, 2003
Optimal re-referencing rate for in-plane dynamic speckle interferometryAngelica Svanbro, Jonathan M Huntley, Abundio Davila
Applied Optics|January 28, 2003
Albumen as a relief recording media for spatial distributions of infrared radiation. Fabrication of interference gratings and microlensesSergio Calixto
Applied Optics|December 13, 2002
Metrology of pulsed radiation for 157-nm lithographyMathias Richter, Udo Kroth, Alexander Gottwald, et al.
Applied Optics|December 13, 2002
Influence of substrate absorption on the optical and geometrical characterization of thin dielectric filmsJuan-María González-Leal, Rafael Prieto-Alcón, José-Andrés Angel, et al.
Applied Optics|December 13, 2002
Measurements of the refractive index of yttrium in the 50-1300-eV energy regionBenjawan Sae-Lao, Regina Soufli
Pageof 5,091

Showing results (1241-1250 of 50,909) with videos related to

Sort By:
Pageof 5,091
Applied Optics|November 5, 2002
Analysis of nanostructured porous films by measurement of adsorption isotherms with optical fiber and ellipsometryAlberto Alvarez-Herrero, Hector Guerrero, Eusebio Bernabeu, et al.
Applied Optics|November 5, 2002
Dopant-dependent reflectivity and refractive index of microcrystalline HxWO3 and LixWO3 bronze thin filmsZahid Hussain
Applied Optics|November 5, 2002
Method for evaluating optical characteristics of endoscopes for recording fluorescence-related cardiac electrical activitySoma Sau, Howard I Bassen, Victor Krauthamer
Applied Optics|January 28, 2003
Digital algorithm for dispersion correction in optical coherence tomography for homogeneous and stratified mediaDaniel L Marks, Amy L Oldenburg, J Joshua Reynolds, et al.
Applied Optics|January 28, 2003
Resolution improvement with dispersion manipulation and a retrieval algorithm in optical coherence tomographyI-Jen Hsu, Chia-Wei Sun, Chih-Wei Lu, et al.
Applied Optics|January 28, 2003
Optimal re-referencing rate for in-plane dynamic speckle interferometryAngelica Svanbro, Jonathan M Huntley, Abundio Davila
Applied Optics|January 28, 2003
Albumen as a relief recording media for spatial distributions of infrared radiation. Fabrication of interference gratings and microlensesSergio Calixto
Applied Optics|December 13, 2002
Metrology of pulsed radiation for 157-nm lithographyMathias Richter, Udo Kroth, Alexander Gottwald, et al.
Applied Optics|December 13, 2002
Influence of substrate absorption on the optical and geometrical characterization of thin dielectric filmsJuan-María González-Leal, Rafael Prieto-Alcón, José-Andrés Angel, et al.
Applied Optics|December 13, 2002
Measurements of the refractive index of yttrium in the 50-1300-eV energy regionBenjawan Sae-Lao, Regina Soufli
Pageof 5,091