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Applied Optics
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June 18, 2002
Laser-induced damage of materials in bulk, thin-film, and liquid forms
Jean-Yves Natoli, Laurent Gallais, Hassan Akhouayri, et al.
Applied Optics
|
June 18, 2002
Single-layer model for surface roughness
C K Carniglia, D G Jensen
Applied Optics
|
June 18, 2002
Automated design and sensitivity analysis of wavelengh-division multiplexing filters
Alexander V Tikhonravov, Michael K Trubetskov
Applied Optics
|
June 18, 2002
Long-wavelength polarizing cutoff filters for the 275-550-nm spectral region
Penghui Ma, J A Dobrowolski, Frances Lin, et al.
Applied Optics
|
June 18, 2002
Light-scattering measurements of optical thin-film components at 157 and 193 nm
Stefan Gliech, Jörg Steinert, Angela Duparré
Applied Optics
|
June 18, 2002
Control of resonant wavelength from organic light-emitting materials by use of a Fabry-Perot microcavity structure
Boo Young Jung, Nam Young Kim, Changhee Lee, et al.
Applied Optics
|
June 18, 2002
Closed-loop phase stepping in a calibrated fiber-optic fringe projector for shape measurement
Andrew J Moore, Roy McBride, James S Barton, et al.
Applied Optics
|
September 25, 2002
Stability analysis of a diode-pumped, thermal birefringence-compensated two-rod Nd:YAG laser with 770-W output power
Sungman Lee, Mijeong Yun, Byung Heon Cha, et al.
Applied Optics
|
September 25, 2002
Optical particle sizing in backscatter
Nils Damaschke, Holger Nobach, Nikolai Semidetnov, et al.
Applied Optics
|
September 25, 2002
Finite-difference time-domain solution of light scattering and absorption by particles in an absorbing medium
Wenbo Sun, Norman G Loeb, Qiang Fu
Page
of 5,091
Search research articles
Search
Showing results (1261-1270 of 50,909) with videos related to
Sort By:
Page
of 5,091
Applied Optics
|
June 18, 2002
Laser-induced damage of materials in bulk, thin-film, and liquid forms
Jean-Yves Natoli, Laurent Gallais, Hassan Akhouayri, et al.
Applied Optics
|
June 18, 2002
Single-layer model for surface roughness
C K Carniglia, D G Jensen
Applied Optics
|
June 18, 2002
Automated design and sensitivity analysis of wavelengh-division multiplexing filters
Alexander V Tikhonravov, Michael K Trubetskov
Applied Optics
|
June 18, 2002
Long-wavelength polarizing cutoff filters for the 275-550-nm spectral region
Penghui Ma, J A Dobrowolski, Frances Lin, et al.
Applied Optics
|
June 18, 2002
Light-scattering measurements of optical thin-film components at 157 and 193 nm
Stefan Gliech, Jörg Steinert, Angela Duparré
Applied Optics
|
June 18, 2002
Control of resonant wavelength from organic light-emitting materials by use of a Fabry-Perot microcavity structure
Boo Young Jung, Nam Young Kim, Changhee Lee, et al.
Applied Optics
|
June 18, 2002
Closed-loop phase stepping in a calibrated fiber-optic fringe projector for shape measurement
Andrew J Moore, Roy McBride, James S Barton, et al.
Applied Optics
|
September 25, 2002
Stability analysis of a diode-pumped, thermal birefringence-compensated two-rod Nd:YAG laser with 770-W output power
Sungman Lee, Mijeong Yun, Byung Heon Cha, et al.
Applied Optics
|
September 25, 2002
Optical particle sizing in backscatter
Nils Damaschke, Holger Nobach, Nikolai Semidetnov, et al.
Applied Optics
|
September 25, 2002
Finite-difference time-domain solution of light scattering and absorption by particles in an absorbing medium
Wenbo Sun, Norman G Loeb, Qiang Fu
Page
of 5,091