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Applied Spectroscopy|December 13, 2012
AFM-IR: combining atomic force microscopy and infrared spectroscopy for nanoscale chemical characterizationAlexandre Dazzi, Craig B Prater, Qichi Hu, et al.
Applied Spectroscopy|December 13, 2012
Pre-visual diagnostics of phosphorus deficiency in mini-cucumber plants using near-infrared reflectance spectroscopyJiyong Shi, Xiaobo Zou, Jiewen Zhao, et al.
Applied Spectroscopy|January 16, 2013
Application of spectroscopic ellipsometry and Mueller ellipsometry to optical characterizationEnric Garcia-Caurel, Antonello De Martino, Jean-Paul Gaston, et al.
Applied Spectroscopy|January 16, 2013
Optoacoustic multispectral imaging of radiolucent foreign bodies in tissueLeland Page, Saher Maswadi, Randolph D Glickman
Applied Spectroscopy|January 16, 2013
A novel method of terahertz spectroscopy and imaging in reflection geometryWei-En Lai, Huai-Wu Zhang, Yao-Hua Zhu, et al.
Applied Spectroscopy|January 16, 2013
Analysis of starch distribution in the paper cross-section by Raman microscopyEnrico Pigorsch, Matthias Finger, Steffen Thiele, et al.
Applied Spectroscopy|January 16, 2013
High-definition infrared spectroscopic imagingRohith K Reddy, Michael J Walsh, Matthew V Schulmerich, et al.
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