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Applied Spectroscopy|September 29, 2023
Application of Optical Photothermal Infrared (O-PTIR) Spectroscopy for Assessment of Bone Composition at the Submicron ScaleEmily Reiner, Frank Weston, Nancy Pleshko, et al.
Applied Spectroscopy|October 3, 2024
Spectral Background Calibration of Scanning Habitable Environments with Raman and Luminescence for Organics and Chemicals (SHERLOC) Spectrometer Onboard the Perseverance Rover Enables Identification of a Ubiquitous Martian Spectral ComponentRyan S Jakubek, Andrea Corpolongo, Rohit Bhartia, et al.
Applied Spectroscopy|September 23, 2024
Feature Selection and Spectral Indices for Identifying Maize Stress TypesYanru Li, Keming Yang, Bing Wu
Applied Spectroscopy|September 24, 2024
Assessing Mechanochemical Properties of Acrylonitrile Butadiene Styrene (ABS) Items in Cultural Heritage Through a Multimodal Spectroscopic ApproachIrene Bargagli, Martina Alunni Cardinali, Valeria Di Tullio, et al.
Applied Spectroscopy|October 13, 2024
Absorption Coefficient Estimation of Pigmented Skin Phantoms Using Colorimetric ParametersLuismar Barbosa da Cruz Junior, Kaio Bernardo de Barros, Carlos Eduardo Girasol, et al.
Applied Spectroscopy|September 26, 2024
Solid State Vanadate Laser and 213 nm Rayleigh Rejection Filter Enable Miniaturized Deep Ultraviolet Raman SpectrometersSergei V Bykov, Sanford A Asher
Applied Spectroscopy|May 26, 2026
EXPRESS: Wave Lensing Effects on a Remote Raman Sensor: Enhanced Mean and the Intensity Distribution of Raman FlashesPaige K Williams, Whitney E Schuler, Zechariah B Kitzhaber, et al.
Applied Spectroscopy|May 26, 2026
EXPRESS: Fractional-Rational Calibration for Laser-Induced Breakdown Spectroscopy (LIBS) Analysis of Steels with High Matrix VariabilityVasilii Kiris, Mikhail Belkov
Applied Spectroscopy|May 26, 2026
EXPRESS: Raman Spectroscopic Characterization of Carotenoid and Phenolic Co-Occurrence in Euphorbia pulcherrima Bracts and InflorescencesLenize F Maia, Mariana T C Campos, Rafael de Oliveira, et al.
Applied Spectroscopy|May 19, 2026
Surface Morphology Analysis of Thin Films of Perfluoroalkanes Using Atomic Force Microscopy-Infrared (AFMIR) with Respect to Surface Phonon-Polariton ModesTakayuki Oka, Nobutaka Shioya, Takeshi Hasegawa
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