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Forensic Science International. Genetics|January 23, 2016
Genetic analysis of 17 Y-STR loci in Han and Korean populations from Jilin Province, Northeast ChinaYinan Han, Liming Li, Xiaoyang Liu, et al.
Forensic Science International. Genetics|January 26, 2016
Strategies for complete mitochondrial genome sequencing on Ion Torrent PGM™ platform in forensic sciencesYishu Zhou, Fei Guo, Jiao Yu, et al.
Forensic Science International. Genetics|February 5, 2016
Massively parallel sequencing of the entire control region and targeted coding region SNPs of degraded mtDNA using a simplified library preparation methodEun Young Lee, Hwan Young Lee, Se Yoon Oh, et al.
Forensic Science International. Genetics|July 31, 2015
Developmental validation of the GlobalFiler(®) Express PCR Amplification Kit: A 6-dye multiplex assay for the direct amplification of reference samplesDennis Y Wang, Siddhita Gopinath, Robert E Lagacé, et al.
Forensic Science International. Genetics|August 16, 2015
Separation of Y-chromosomal haplotypes from male DNA mixtures via multiplex haplotype-specific extractionJessica Rothe, Marion Nagy
Forensic Science International. Genetics|January 18, 2015
Investigating a common approach to DNA profile interpretation using probabilistic softwareStuart Cooper, Catherine McGovern, Jo-Anne Bright, et al.
Forensic Science International. Genetics|December 10, 2014
A novel multiplex assay amplifying 13 Y-STRs characterized by rapid and moderate mutation rateUrszula Rogalla, Marcin Woźniak, Jacek Swobodziński, et al.
Forensic Science International. Genetics|December 10, 2014
Molecular approaches for forensic cell type identification: On mRNA, miRNA, DNA methylation and microbial markersTitia Sijen
Forensic Science International. Genetics|January 13, 2015
Variation of X-chromosomal microsatellites in Belarus within the context of their genetic diversity in EuropeKrzysztof Rębała, Svetlana A Kotova, Veranika I Rybakova, et al.
Forensic Science International. Genetics|July 29, 2015
Probabilistic characterisation of baseline noise in STR profilesUllrich J Mönich, Ken Duffy, Muriel Médard, et al.
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