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IEEE Transactions on Pattern Analysis and Machine Intelligence|April 28, 2010
Transformation of general binary MRF minimization to the first-order caseHiroshi IshikawaIEEE Transactions on Pattern Analysis and Machine Intelligence|May 19, 2010
Active testing for face detection and localizationRaphael Sznitman, Bruno JedynakIEEE Transactions on Pattern Analysis and Machine Intelligence|June 19, 2010
A variational approach to degraded document enhancementReza Farrahi Moghaddam, Mohamed CherietIEEE Transactions on Pattern Analysis and Machine Intelligence|June 19, 2010
Accurate, dense, and robust multiview stereopsisYasutaka Furukawa, Jean PonceIEEE Transactions on Pattern Analysis and Machine Intelligence|October 27, 2006
Evaluation of stability of k-means cluster ensembles with respect to random initializationLudmila I Kuncheva, Dmitry P VetrovIEEE Transactions on Pattern Analysis and Machine Intelligence|June 15, 2007
A variational approach to problems in calibration of multiple camerasGozde Unal, Anthony Yezzi, Stefano Soatto, et al.IEEE Transactions on Pattern Analysis and Machine Intelligence|June 15, 2007
Probabilistic context-free grammars estimated from infinite distributionsAnna Corazza, Giorgio SattaIEEE Transactions on Pattern Analysis and Machine Intelligence|June 15, 2007
Information discriminant analysis: feature extraction with an information-theoretic objectiveZoran NenadicIEEE Transactions on Pattern Analysis and Machine Intelligence|June 15, 2007
TEXEMS: texture exemplars for defect detection on random textured surfacesXianghua Xie, Majid MirmehdiIEEE Transactions on Pattern Analysis and Machine Intelligence|June 15, 2007
Image noise induced errors in camera positioningGraziano Chesi, Y S HungPageof 866