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IEEE Transactions on Pattern Analysis and Machine Intelligence|November 17, 2006
A statistics-based approach to binary image registration with uncertainty analysisKatherine M Simonson, Steven M Drescher, Franklin R Tanner
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 10, 2005
Edge-based identification of DP-features on free-form solidsT Lim, H Medellin, C Torres-Sanchez, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 10, 2005
Object-based image analysis using multiscale connectivityUlisses Braga-Neto, John Goutsias
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 10, 2005
A theoretical and experimental analysis of linear combiners for multiple classifier systemsGiorgio Fumera, Fabio Roli
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 10, 2005
The angular difference function and its application to image registrationYosi Keller, Yoel Shkolnisky, Amir Averbuch
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 10, 2005
Fast unambiguous stereo matching using reliability-based dynamic programmingMinglun Gong, Yee-Hong Yang
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 15, 2005
Parsing with probabilistic strictly locally testable tree languagesJose Luis Verdú-Mas, Rafael C Carrasco, Jorge Calera-Rubio
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 15, 2005
Learning deterministic finite automata with a smart state labeling evolutionary algorithmSimon M Lucas, T Jeff Reynolds
IEEE Transactions on Pattern Analysis and Machine Intelligence|May 19, 2010
MRF energy minimization and beyond via dual decompositionNikos Komodakis, Nikos Paragios, Georgios Tziritas
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 10, 2010
Topology-adaptive mesh deformation for surface evolution, morphing, and multiview reconstructionAndrei Zaharescu, Edmond Boyer, Radu Horaud
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