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IEEE Transactions on Reliability|May 17, 2019
Finding Bugs in Cryptographic Hash Function ImplementationsNicky Mouha, Mohammad S Raunak, D Richard Kuhn, et al.
IEEE Transactions on Reliability|July 9, 2020
A Study on Effects of Copper Wrap Specifications on Printed Circuit Board ReliabilityBhanu Sood, John Shue, Jesse Leitner, et al.
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