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IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|March 22, 2022
A Prototype System With Custom-Designed RX ICs for Contrast-Enhanced Ultrasound ImagingMeiyi Zhou, Peiran Chen, Andreas M A O Pollet, et al.
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|March 3, 2022
An Algorithm for Solving the Phase Ambiguity Problem of SAW Delay-Line Sensor SystemsJunhao Cao, Zixiao Lu, Yahui Tian, et al.
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|March 3, 2022
Piezoelectric Lateral-Extensional Mode Resonators With Reconfigurable Electrode and Resonance Mode-Switching Behavior Enabled by a VO₂ Thin-FilmTing Hung Liu, Xu Han, Juan Pastrana, et al.
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|May 31, 2001
Thermostatic and dynamic performance of an ultrasonic density probeJ van Deventer, J Delsing
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|May 31, 2001
Travelling wave ultrasonic motor using the B08 flexural mode of a circular membraneP J Rayner, R W Whatmore
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|May 31, 2001
Implementing guided wave mode control by use of a phased transducer arrayJ Li, J L Rose
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|May 31, 2001
Bulk acoustic wave sensors for sensing measurand-induced electrical property changes in solutionsC Zhang, J F Vetelino
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|May 31, 2001
Model-based estimation of ultrasonic echoes. Part I: analysis and algorithmsR Demirli, J Saniie
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|May 31, 2001
Compact, high-Q, zero temperature coefficient, TE011 sapphire-rutile microwave distributed Bragg reflector resonatorsM E Tobar, D Cros, P Blondy, et al.
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|May 31, 2001
Measuring Lamb wave dispersion curves of a bi-layered plate and its application on material characterization of coatingY C Lee, S W Cheng
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