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Journal of X-Ray Science and Technology|February 11, 2011
Thermal x-ray emission from ion-beam-heated matterM Murakami, J Meyer-Ter-Vehn, R RamisJournal of X-Ray Science and Technology|February 11, 2011
Measurement of x-ray spectral line wavelengths by using two bragg reflectionsA V Rodé, A M Maksimchuk, G V Sklizkov, et al.Journal of X-Ray Science and Technology|February 11, 2011
Effective Area of the AXAF X-Ray Telescope: Dependence upon Dielectric Constants of Coating MaterialsR F Elsner, S L O'Dell, M C WeisskopfJournal of X-Ray Science and Technology|February 11, 2011
A review of microfabrication technologies: application to x-ray opticsC Khan MalekJournal of X-Ray Science and Technology|February 11, 2011
A scanning soft x-ray microscope with an ellipsoidal focusing mirrorJ Voss, H Dadras, C Kunz, et al.Journal of X-Ray Science and Technology|February 11, 2011
A Soft X-Ray/EUV Reflectometer Based on a Laser Produced Plasma SourceE M Gullikson, J H Underwood, P C Batson, et al.Journal of X-Ray Science and Technology|February 11, 2011
Magnetic form factor of nickel determined by white beam x-ray diffractionE Zukowski, M J Cooper, R Armstrong, et al.Journal of X-Ray Science and Technology|February 11, 2011
Picosecond X-Ray Pulses Generated in a Diode Driven by 193-nm Picosecond Laser PulsesI V Tomov, T Anderson, P M RentzepisJournal of X-Ray Science and Technology|February 11, 2011
Application of scanning microradiography and x-ray microtomography to studies of bones and teethJ C Elliott, P Anderson, X J Gao, et al.Journal of X-Ray Science and Technology|February 11, 2011
Digitization and image processing methods for enhancement and quantification of grazing-incidence x-ray topographsJ Rheinländer, S Abdali, E Zielinska-RohozinskaPageof 138