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Journal of X-Ray Science and Technology|February 11, 2011
Wave-front distortion of high-order harmonic beams caused by intensity-dependent emission phasesJ Peatross, M V Fedorov, D D MeyerhoferJournal of X-Ray Science and Technology|February 11, 2011
Multiple reflections in single crystals as a tool for x-ray spectroscopyB S FraenkelJournal of X-Ray Science and Technology|February 11, 2011
Phosphors for luminescent image platesC Hall, I A Kamenskikh, A M Gurvich, et al.Journal of X-Ray Science and Technology|February 11, 2011
An analysis of biological hard tissues using the tomographic reconstruction error formulaG R Davis, P Munshi, J C ElliottJournal of X-Ray Science and Technology|February 11, 2011
Pinch plasma source for x-ray microscopy with nanosecond exposure timeR Lebert, W Neff, D RothweilerJournal of X-Ray Science and Technology|February 11, 2011
Effects of a near-surface transition layer on x-ray reflection and scatteringI A Artioukov, V E Asadchikov, I V KozhevnikovJournal of X-Ray Science and Technology|February 11, 2011
Action Constant for Bremsstrahlung from Electron-and-Nucleus CollisionsW I LinlorJournal of X-Ray Science and Technology|February 11, 2011
Influence of the Number of Bilayers on the Optical Performances of X-UV Multilayer Interferential MirrorsC Guichet, R Rivoira, G Rasigni, et al.Journal of X-Ray Science and Technology|February 11, 2011
X-Ray Crystal Spectroscopy of Sub-picosecond Laser-Produced Plasmas beyond 50 keVG Hölzer, E Förster, M Grätz, et al.Journal of X-Ray Science and Technology|February 11, 2011
Projected advances in laboratory soft x-ray systems and their applicationsA G MichettePageof 138