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Journal of Applied Crystallography|December 26, 2022
Improving data quality for three-dimensional electron diffraction by a post-column energy filter and a new crystal tracking methodTaimin Yang, Hongyi Xu, Xiaodong Zou
Journal of Applied Crystallography|December 17, 2016
Structure beyond pair correlations: X-ray cross-correlation from colloidal crystalsFelix Lehmkühler, Birgit Fischer, Leonard Müller, et al.
Journal of Applied Crystallography|December 17, 2016
The use of haptic interfaces and web services in crystallography: an application for a 'screen to beam' interfaceAndrew E Bruno, Alexei S Soares, Robin L Owen, et al.
Journal of Applied Crystallography|March 4, 2014
Global small-angle X-ray scattering data analysis for multilamellar vesicles: the evolution of the scattering density profile modelPeter Heftberger, Benjamin Kollmitzer, Frederick A Heberle, et al.
Journal of Applied Crystallography|April 7, 2017
Debye-Waller coefficient of heavily deformed nanocrystalline ironP Scardi, L Rebuffi, M Abdellatief, et al.
Journal of Applied Crystallography|April 7, 2017
Scanning X-ray nanodiffraction from ferroelectric domains in strained K0.75Na0.25NbO3 epitaxial films grown on (110) TbScO3Martin Schmidbauer, Michael Hanke, Albert Kwasniewski, et al.
Journal of Applied Crystallography|April 7, 2017
The fluence-resolution relationship in holographic and coherent diffractive imagingJohannes Hagemann, Tim Salditt
Journal of Applied Crystallography|October 15, 2016
Guinier peak analysis for visual and automated inspection of small-angle X-ray scattering dataChristopher D Putnam
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