Showing results (311-320 of 1,114) with videos related to
Sort By:
Pageof 112
Journal of Applied Crystallography|December 17, 2016
Contrast variation by dynamic nuclear polarization and time-of-flight small-angle neutron scattering. I. Application to industrial multi-component nanocompositesYohei Noda, Satoshi Koizumi, Tomomi Masui, et al.Journal of Applied Crystallography|December 17, 2016
Small-angle scattering and morphologies of ultra-flexible microemulsionsSylvain Prevost, Tobias Lopian, Maximilian Pleines, et al.Journal of Applied Crystallography|December 17, 2016
Use of small-angle X-ray scattering to resolve intracellular structure changes of Escherichia coli cells induced by antibiotic treatmentA R von Gundlach, V M Garamus, T M Willey, et al.Journal of Applied Crystallography|December 17, 2016
Combinatorial refinement of thin-film microstructure, properties and process conditions: iterative nanoscale search for self-assembled TiAlN nanolamellaeJ Zalesak, J Todt, R Pitonak, et al.Journal of Applied Crystallography|December 17, 2016
Synchrotron-based macromolecular crystallography module for an undergraduate biochemistry laboratory courseKyle M Stiers, Christopher B Lee, Jay C Nix, et al.Journal of Applied Crystallography|December 17, 2016
ContaMiner and ContaBase: a webserver and database for early identification of unwantedly crystallized protein contaminantsArnaud Hungler, Afaque Momin, Kay Diederichs, et al.Journal of Applied Crystallography|April 7, 2017
On the use of two-time correlation functions for X-ray photon correlation spectroscopy data analysisOier BikondoaJournal of Applied Crystallography|April 7, 2017
Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffractionDominik Kriegner, Petr Harcuba, Jozef Veselý, et al.Journal of Applied Crystallography|April 7, 2017
Joint small-angle X-ray and neutron scattering data analysis of asymmetric lipid vesiclesBarbara Eicher, Frederick A Heberle, Drew Marquardt, et al.Journal of Applied Crystallography|April 7, 2017
NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray ScatteringAndrew J Allen, Fan Zhang, R Joseph Kline, et al.Pageof 112