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Journal of Applied Crystallography|April 7, 2017
Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packagesB K Tanner, A N Danilewsky, R K Vijayaraghavan, et al.Journal of Applied Crystallography|April 7, 2017
Quantitative evaluation of statistical errors in small-angle X-ray scattering measurementsSteffen M Sedlak, Linda K Bruetzel, Jan LipfertJournal of Applied Crystallography|March 4, 2014
Refinement of macromolecular structures against neutron data with SHELXL2013.Tim Gruene, Hinrich W Hahn, Anna V Luebben, et al.Journal of Applied Crystallography|October 15, 2016
Magnetic scattering in the simultaneous measurement of small-angle neutron scattering and Bragg edge transmission from steelYojiro Oba, Satoshi Morooka, Kazuki Ohishi, et al.Journal of Applied Crystallography|October 15, 2016
Formation of swift heavy ion tracks on a rutile TiO2 (001) surfaceMarko Karlušić, Sigrid Bernstorff, Zdravko Siketić, et al.Journal of Applied Crystallography|August 10, 2019
A temperature-controlled cold-gas humidifier and its application to protein crystals with the humid-air and glue-coating methodSeiki Baba, Atsuhiro Shimada, Nobuhiro Mizuno, et al.Journal of Applied Crystallography|August 10, 2019
A novel methodology to study nanoporous alumina by small-angle neutron scatteringAnastasia Christoulaki, Alexis Chennevière, Isabelle Grillo, et al.Journal of Applied Crystallography|October 17, 2022
Refinements for Bragg coherent X-ray diffraction imaging: electron backscatter diffraction alignment and strain field computationDavid Yang, Mark T Lapington, Guanze He, et al.Journal of Applied Crystallography|October 17, 2022
The Scatman: an approximate method for fast wide-angle scattering simulationsAlessandro Colombo, Julian Zimmermann, Bruno Langbehn, et al.Pageof 112