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Journal of Applied Crystallography|June 20, 2022
Optimization and inference of bin widths for histogramming inelastic neutron scattering spectraKazuyoshi Tatsumi, Yasuhiro Inamura, Maiko Kofu, et al.Journal of Applied Crystallography|June 20, 2022
Classification of diffraction patterns using a convolutional neural network in single-particle-imaging experiments performed at X-ray free-electron lasersDameli Assalauova, Alexandr Ignatenko, Fabian Isensee, et al.Journal of Applied Crystallography|February 13, 2020
Tuning the optical isotropic point of mixed crystals of ethylenediammonium sulfate/selenateMelissa Tan, Alexander T Martin, Alexander G Shtukenberg, et al.Journal of Applied Crystallography|February 13, 2020
Real- and Q-space travelling: multi-dimensional distribution maps of crystal-lattice strain (∊044) and tilt of suspended monolithic silicon nanowire structuresSimone Dolabella, Ruggero Frison, Gilbert A Chahine, et al.Journal of Applied Crystallography|February 13, 2020
Li-ion half-cells studied operando during cycling by small-angle neutron scatteringJohannes Hattendorff, Stefan Seidlmayer, Hubert A Gasteiger, et al.Journal of Applied Crystallography|February 13, 2020
Mercury 4.0: from visualization to analysis, design and predictionClare F Macrae, Ioana Sovago, Simon J Cottrell, et al.Journal of Applied Crystallography|July 21, 2020
Impact and behavior of Sn during the Ni/GeSn solid-state reactionAndrea Quintero, Patrice Gergaud, Jean-Michel Hartmann, et al.Journal of Applied Crystallography|July 21, 2020
X-ray diffraction using focused-ion-beam-prepared single crystalsTina Weigel, Claudia Funke, Matthias Zschornak, et al.Journal of Applied Crystallography|July 21, 2020
Accurate high-resolution single-crystal diffraction data from a Pilatus3 X CdTe detectorLennard Krause, Kasper Tolborg, Thomas Bjørn Egede Grønbech, et al.Journal of Applied Crystallography|July 21, 2020
Measurement of single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near πP V Gureva, N V Marchenkov, A N Artemev, et al.Pageof 112