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Journal of Applied Crystallography|July 21, 2020
Pattern-matching indexing of Laue and monochromatic serial crystallography data for applications in materials scienceCatherine Dejoie, Nobumichi TamuraJournal of Applied Crystallography|June 20, 2015
Towards multi-order hard X-ray imaging with multilayer zone platesMarkus Osterhoff, Christian Eberl, Florian Döring, et al.Journal of Applied Crystallography|June 20, 2015
Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imagingM G Tsoutsouva, V A Oliveira, J Baruchel, et al.Journal of Applied Crystallography|June 20, 2015
Ab initio simulation of diffractometer instrumental function for high-resolution X-ray diffractionAlexander Mikhalychev, Andrei Benediktovitch, Tatjana Ulyanenkova, et al.Journal of Applied Crystallography|June 20, 2015
Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III-V photonics platform on silicon using a laboratory X-ray diffraction setupYan Ping Wang, Antoine Letoublon, Tra Nguyen Thanh, et al.Journal of Applied Crystallography|June 20, 2015
A step towards long-wavelength protein crystallography: subjecting protein crystals to a vacuumSantosh Panjikar, Lars Thomsen, Kane Michael O'Donnell, et al.Journal of Applied Crystallography|June 20, 2015
SynchWeb: a modern interface for ISPyBS J Fisher, K E Levik, M A Williams, et al.Journal of Applied Crystallography|June 20, 2015
DSR: enhanced modelling and refinement of disordered structures with SHELXLDaniel Kratzert, Julian J Holstein, Ingo KrossingJournal of Applied Crystallography|June 20, 2015
SCT: a suite of programs for comparing atomistic models with small-angle scattering dataDavid W Wright, Stephen J PerkinsJournal of Applied Crystallography|June 20, 2015
McSAS: software for the retrieval of model parameter distributions from scattering patternsI Bressler, B R Pauw, A F ThünemannPageof 112