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Journal of Applied Crystallography|September 23, 2014
Erratum: Neutron and X-ray diffraction study of ferrite nanocrystals obtained by microwave-assisted growth. A structural comparison with the thermal synthetic route. CorrigendumEduardo Solano, Carlos Frontera, Inés Puente Orench, et al.Journal of Applied Crystallography|September 27, 2013
Complete elliptical ring geometry provides energy and instrument calibration for synchrotron-based two-dimensional X-ray diffractionMichael L Hart, Michael Drakopoulos, Christina Reinhard, et al.Journal of Applied Crystallography|March 4, 2016
Extension of the sasCIF format and its applications for data processing and depositionMichael Kachala, John Westbrook, Dmitri SvergunJournal of Applied Crystallography|December 15, 2015
Tuning the instrument resolution using chopper and time of flight at the small-angle neutron scattering diffractometer KWS-2Aurel Radulescu, Noémi Kinga Székely, Stephan Polachowski, et al.Journal of Applied Crystallography|December 15, 2015
Atomic disorder of Li0.5Ni0.5O thin films caused by Li doping: estimation from X-ray Debye-Waller factorsAnli Yang, Osami Sakata, Ryosuke Yamauchi, et al.Journal of Applied Crystallography|August 26, 2015
Methods for analysis of size-exclusion chromatography-small-angle X-ray scattering and reconstruction of protein scatteringAndrew W Malaby, Srinivas Chakravarthy, Thomas C Irving, et al.Journal of Applied Crystallography|August 26, 2015
Computation of diffuse scattering arising from one-phonon excitations in a neutron time-of-flight single-crystal Laue diffraction experimentMatthias J Gutmann, Gabriella Graziano, Sanghamitra Mukhopadhyay, et al.Journal of Applied Crystallography|August 26, 2015
Programming new geometry restraints: parallelity of atomic groupsOleg V Sobolev, Pavel V Afonine, Paul D Adams, et al.Journal of Applied Crystallography|August 26, 2015
A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mappingWilliam Whitley, Chris Stock, Andrew D HuxleyJournal of Applied Crystallography|August 16, 2017
Ewald: an extended wide-angle Laue diffractometer for the second target station of the Spallation Neutron SourceLeighton Coates, Lee RobertsonPageof 112