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Journal of electron microscopy

Showing results (461-470 of 1,155) with videos related to

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Journal of Electron Microscopy|December 8, 2004
Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling systemZhouguang Wang, Takeharu Kato, Tsukasa Hirayama
Journal of Electron Microscopy|December 8, 2004
Post-thinning technique for a lifted-out membraneShoji Sadayama, Yasuhiko Sugiyama, Koji Iwasaki, et al.
Journal of Electron Microscopy|December 8, 2004
FIB and TEM observations of defects in hot-dip zinc coatingsMoon-Hi Hong, Hiroyasu Saka
Journal of Electron Microscopy|December 8, 2004
Microstructures of galvannealing coats plated on an iron substrate deformed by indentationKoji Kobayashi, Hiroyasu Saka
Journal of Electron Microscopy|December 8, 2004
Crystallographic orientation contrast associated with Ga+ ion channelling for Fe and Cu in focused ion beam methodY Yahiro, K Kaneko, T Fujita, et al.
Journal of Electron Microscopy|December 8, 2004
Direct observation of electrostatic microfields by four-electron-wave interference using two electron biprismsKimiya Miyashita, Kazuo Yamamoto, Tsukasa Hirayama, et al.
Journal of Electron Microscopy|December 8, 2004
HAADF-STEM study on the early stage of precipitation in aged Al-Ag alloysToyohiko J Konno, Eiji Okunishi, Tetsu Ohsuna, et al.
Journal of Electron Microscopy|December 8, 2004
Influence of the image quality deterioration of a tilted thick specimen on electron tomographyHai-Bo Zhang, Chao Yang, Akio Takaoka
Journal of Electron Microscopy|December 8, 2004
Yellow pigment granules in hornets: their origin and developmentJacob S Ishay, Dmitry Galushko, Natalya Ermakov, et al.
Journal of Electron Microscopy|December 8, 2004
The position and morphology of honeycombs in normal skeletal muscle fibres of the healthy frogTilman Voigt, Wolfgang Dauber
Pageof 116

Showing results (461-470 of 1,155) with videos related to

Sort By:
Pageof 116
Journal of Electron Microscopy|December 8, 2004
Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling systemZhouguang Wang, Takeharu Kato, Tsukasa Hirayama
Journal of Electron Microscopy|December 8, 2004
Post-thinning technique for a lifted-out membraneShoji Sadayama, Yasuhiko Sugiyama, Koji Iwasaki, et al.
Journal of Electron Microscopy|December 8, 2004
FIB and TEM observations of defects in hot-dip zinc coatingsMoon-Hi Hong, Hiroyasu Saka
Journal of Electron Microscopy|December 8, 2004
Microstructures of galvannealing coats plated on an iron substrate deformed by indentationKoji Kobayashi, Hiroyasu Saka
Journal of Electron Microscopy|December 8, 2004
Crystallographic orientation contrast associated with Ga+ ion channelling for Fe and Cu in focused ion beam methodY Yahiro, K Kaneko, T Fujita, et al.
Journal of Electron Microscopy|December 8, 2004
Direct observation of electrostatic microfields by four-electron-wave interference using two electron biprismsKimiya Miyashita, Kazuo Yamamoto, Tsukasa Hirayama, et al.
Journal of Electron Microscopy|December 8, 2004
HAADF-STEM study on the early stage of precipitation in aged Al-Ag alloysToyohiko J Konno, Eiji Okunishi, Tetsu Ohsuna, et al.
Journal of Electron Microscopy|December 8, 2004
Influence of the image quality deterioration of a tilted thick specimen on electron tomographyHai-Bo Zhang, Chao Yang, Akio Takaoka
Journal of Electron Microscopy|December 8, 2004
Yellow pigment granules in hornets: their origin and developmentJacob S Ishay, Dmitry Galushko, Natalya Ermakov, et al.
Journal of Electron Microscopy|December 8, 2004
The position and morphology of honeycombs in normal skeletal muscle fibres of the healthy frogTilman Voigt, Wolfgang Dauber
Pageof 116