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Journal of Electron Microscopy|December 7, 2000
Fluctuation microscopy: a probe of atomic correlations in disordered materialsVoyles, Gibson, TreacyJournal of Electron Microscopy|December 7, 2000
Plasmon-loss imaging of chains of crystalline-silicon nanospheres and silicon nanowiresKohno, Takeda, TanakaJournal of Electron Microscopy|December 7, 2000
Quantitative TEM of point defects in SiEaglesham, Venezia, Gossmann, et al.Journal of Electron Microscopy|December 7, 2000
Mechanism for secondary electron dopant contrast in the SEMSealy, Castell, WilshawJournal of Electron Microscopy|May 3, 2000
Morphology and structure of various phases at the bonding interface of Al/steel formed by explosive weldingLi, Hashimoto, Sukedai, et al.Journal of Electron Microscopy|May 3, 2000
High precision phase-shifting electron holographyYamamoto, Kawajiri, Tanji, et al.Journal of Electron Microscopy|May 3, 2000
Digital high-resolution electron microscopy of atomic disordering in YB56OkuJournal of Electron Microscopy|May 3, 2000
Static capacitance contrast of LSI covered with an insulator film in low accelerating voltage scanning electron microscopeUra, AoyagiJournal of Electron Microscopy|May 3, 2000
Simulation of the effect of magnification and image-rotation variations on three-dimensional reconstructionZhang, Kashiwagi, TakaokaJournal of Electron Microscopy|May 3, 2000
Morphological changes of capillaries in the rat soleus muscle following experimental tenotomyJ Desaki, S Oki, Y Matsuda, et al.Pageof 116