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Journal of Microscopy|May 16, 2000
Long freeze-drying times are not necessary during the preparation of thin sections for X-ray microanalysisA Warley, J N SkepperJournal of Microscopy|March 1, 1979
Scanning electron microscopy of uncoated human metaphase chromosomesL R Sweney, L F Lam, B L ShapiroJournal of Microscopy|August 12, 1999
A method for characterizing longitudinal chromatic aberration of microscope objectives using a confocal optical systemJuskaitis, WilsonJournal of Microscopy|August 12, 1999
Three-dimensional morphometry in scanning electron microscopy: a technique for accurate dimensional and angular measurements of microstructures using stereopaired digitized images and digital image analysisB Minnich, H Leeb, E W Bernroider, et al.Journal of Microscopy|August 12, 1999
Crystal structure retrieval by maximum entropy analysis of atomic resolution incoherent imagesMcGibbon, Pennycook, JessonJournal of Microscopy|February 26, 2000
A wavefront generator for complex pupil function synthesis and point spread function engineeringNeil, Wilson, JuskaitisJournal of Microscopy|February 26, 2000
Unsupervised approval criteria for automated EBSP investigation of deformed metalsGodfrey, LassenJournal of Microscopy|July 8, 2000
Quantification of boundary segregation in the analytical electron microscopeKeast, WilliamsJournal of Microscopy|August 25, 1999
Second-order stereology and ultrastructural examination of the spatial arrangements of tissue compartments within glomeruli of normal and diabetic kidneysT M MayhewJournal of Microscopy|August 25, 1999
Secondary phase distribution analysis via finite body tessellationBoselli, Pitcher, Gregson, et al.Pageof 485