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Journal of Microscopy|May 13, 1999
Using the Hough transform for HOLZ line identification in convergent beam electron diffractionKrämer, MayerJournal of Microscopy|May 13, 1999
Relativistic calculations of intensity distributions in elemental maps using contrast transfer functionsKnippelmeyer, KohlJournal of Microscopy|May 13, 1999
Defect formation in self-assembling quantum dots of InGaAs on GaAs: a case study of direct measurements of local strain from HREMJin-Phillipp, PhillippJournal of Microscopy|May 13, 1999
Quantitative analysis of ultrathin doping layers in semiconductors using high-angle annular dark field imagesLiu, Preston, Boothroyd, et al.Journal of Microscopy|May 13, 1999
Energy filtering transmission electron microscopy using the new JEM-2010FEFTomokiyo, Matsumura, ManabeJournal of Microscopy|September 30, 2000
Testing local dependence of spatial structures on imagesChadoeuf, Brix, Pierret, et al.Journal of Microscopy|September 30, 2000
A two-channel four-dimensional image recording and viewing system with automatic drift correctionT R BürglinJournal of Microscopy|December 14, 1999
Membrane ion channels as physiological targets for local Ca2+ signallingD V Gordienko, A V Zholos, T B BoltonJournal of Microscopy|September 1, 1975
A comparative study in the transmission electron microscope and scanning electron microscope of intracellular structures in sheep heart muscle cellsR Myklebust, H Dalen, T S SaetersdalPageof 482