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Journal of microscopy

Showing results (141-150 of 5,192) with videos related to

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Journal of Microscopy|September 1, 1986
A rapid and simple technique for correlating light microscopy, transmission and scanning electron microscopy of fixed tissues in Epon blocksS B Cajander
Journal of Microscopy|July 5, 2019
Study of recovery and first recrystallisation kinetics in CGO Fe3%Si steels using misorientation-derived parameters (EBSD)F Cruz-Gandarilla, R E Bolmaro, H F Mendoza-León, et al.
Journal of Microscopy|April 18, 2019
Multiple parametric nanoscale measurements with high sensitivity based on through-focus scanning optical microscopyR Peng, Y Qu, J Hao, et al.
Journal of Microscopy|March 1, 2022
Material characteristics of historic scagliola interiors in Vienna: A view through the microscopeKatharina Fuchs, Farkas Pintér
Journal of Microscopy|May 13, 1999
EditorialErnst, Mayer, Rühle
Journal of Microscopy|May 13, 1999
Using the Hough transform for HOLZ line identification in convergent beam electron diffractionKrämer, Mayer
Journal of Microscopy|May 13, 1999
Relativistic calculations of intensity distributions in elemental maps using contrast transfer functionsKnippelmeyer, Kohl
Journal of Microscopy|May 13, 1999
Defect formation in self-assembling quantum dots of InGaAs on GaAs: a case study of direct measurements of local strain from HREMJin-Phillipp, Phillipp
Journal of Microscopy|May 13, 1999
Quantitative analysis of ultrathin doping layers in semiconductors using high-angle annular dark field imagesLiu, Preston, Boothroyd, et al.
Journal of Microscopy|May 13, 1999
Energy filtering transmission electron microscopy using the new JEM-2010FEFTomokiyo, Matsumura, Manabe
Pageof 520

Showing results (141-150 of 5,192) with videos related to

Sort By:
Pageof 520
Journal of Microscopy|September 1, 1986
A rapid and simple technique for correlating light microscopy, transmission and scanning electron microscopy of fixed tissues in Epon blocksS B Cajander
Journal of Microscopy|July 5, 2019
Study of recovery and first recrystallisation kinetics in CGO Fe3%Si steels using misorientation-derived parameters (EBSD)F Cruz-Gandarilla, R E Bolmaro, H F Mendoza-León, et al.
Journal of Microscopy|April 18, 2019
Multiple parametric nanoscale measurements with high sensitivity based on through-focus scanning optical microscopyR Peng, Y Qu, J Hao, et al.
Journal of Microscopy|March 1, 2022
Material characteristics of historic scagliola interiors in Vienna: A view through the microscopeKatharina Fuchs, Farkas Pintér
Journal of Microscopy|May 13, 1999
EditorialErnst, Mayer, Rühle
Journal of Microscopy|May 13, 1999
Using the Hough transform for HOLZ line identification in convergent beam electron diffractionKrämer, Mayer
Journal of Microscopy|May 13, 1999
Relativistic calculations of intensity distributions in elemental maps using contrast transfer functionsKnippelmeyer, Kohl
Journal of Microscopy|May 13, 1999
Defect formation in self-assembling quantum dots of InGaAs on GaAs: a case study of direct measurements of local strain from HREMJin-Phillipp, Phillipp
Journal of Microscopy|May 13, 1999
Quantitative analysis of ultrathin doping layers in semiconductors using high-angle annular dark field imagesLiu, Preston, Boothroyd, et al.
Journal of Microscopy|May 13, 1999
Energy filtering transmission electron microscopy using the new JEM-2010FEFTomokiyo, Matsumura, Manabe
Pageof 520