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Journal of Microscopy|April 1, 1979
A scanning microinterferometer with correction of errors caused by overlapping 'ghost' imagesJ E De Josselin De Jong, J Loeve, H Richter, et al.
Journal of Microscopy|April 18, 2015
Investigation of C3S hydration by environmental scanning electron microscopeY Sakalli, R Trettin
Journal of Microscopy|April 17, 2021
Determination of the refractive index and wavelength-dependent optical properties of few-layer CrCl within the Fresnel formalismShafaq Kazim, Roberto Gunnella, Marco Zannotti, et al.
Journal of Microscopy|October 20, 2012
Using cross-correlation for automated stitching of two-dimensional multi-tile electron backscatter diffraction dataA L Pilchak, A R Shiveley, P A Shade, et al.
Journal of Microscopy|October 20, 2012
Automatic section thickness determination using an absolute gradient focus functionD T Elozory, K A Kramer, B Chaudhuri, et al.
Journal of Microscopy|January 1, 1990
Three-dimensional electron microscopy of entire cellsC Bron, P Gremillet, D Launay, et al.
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