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Journal of Microscopy|August 12, 1999
Influence of crystal orientation on oxygen analysis in NiO with energy dispersive X-ray analysisLuke, Ewert, Schmitz, et al.
Journal of Microscopy|August 12, 1999
The effect of large solid angles of collection on quantitative X-ray microanalysis in the AEMM Watanabe, D W Ackland, D B Williams
Journal of Microscopy|August 12, 1999
A comparative study of colloidal particles as imaging standards for microscopyJ A Derose, J Revel
Journal of Microscopy|August 25, 1999
Resolution beyond the rayleigh limit using beam displacementSomekh, Liu, See
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